A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• , but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging. Keywords: atomic force microscopy; atomic resolution; instrumentation design; multimodal operation; ultrahigh vacuum; Introduction Atomic force microscopy (AFM) operated under vacuum or

Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1649–1663, doi:10.3762/bjnano.5.176

• – multimodal operation Multi-frequency AFM [13] is a family of techniques in which the cantilever probe is driven simultaneously at more than one frequency with the purpose of expanding the amount and type of information that can be acquired during each scan. Most commonly this is accomplished by driving

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

• Santiago D. Solares,
• Sangmin An and
• Christian J. Long

Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175

• controls scheme and to guarantee physically meaningful results. Our simulations show that the highest (least perturbable) eigenmodes retain their ideal response even in multimodal operation. However, it is possible that the response of the lowest eigenmode, excluding the fundamental eigenmode, will be